Eclipse MA200
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مواصفات المنتج
| الماركة | JLM |
| الحالة | New |
| الكفالة | YES |
مواصفات المنتج
Key Features :
Compact, Durable Design
The compact design employs internal turrets that keep dust off the illumination filters, maintaining bright uniform illumination. Also, the power supply is built-in to save space.
User-Friendly Operation
- Controls - All controls are on the front of the instrument for maximum operability.
- Quick Status Check - The observation position of the objective lens and sample can be checked easily from the microscope's front panel.
- Analyzer/Polarizer Interlock Mechanism - Links the attachment/release of the analyzer/polarizer.
World-class CFI60 Optical System
Nikon's world-class CFI60 optics provide clear, high-contrast brightfield images and darkfield images with three times the brightness of conventional models.
Features:
- Top optical performance in all observation methods
- Optimized for advanced digital imaging
- Provide flat and sharp images
- Lead-free optical system
Even Illumination
Improved uniformity of illumination delivers clear images, especially for digital imaging.
Wide Field of View
The MA200 features a super-wide field of view with an eyepiece diameter of 25mm. With the combination of the newly developed 1x objective lens, a sample of 25mm diameter can be observed in a single field of view.
Image Analysis
Status Display
Displays information such as objective lens magnification and illumination conditions. The calibration data is automatically changed when the objective magnification is changed. This feature makes the measurement function and other optional software modules such as grain sizing and cast iron analysis module in the NIS-Elements easy to use
Stitching
Adjacent images can be put together to create an image with a wide field. It is now possible to capture even more vivid images due to the improved uniformity of the illumination system.
Grain Size Measurement
Measures grain size and displays results based on JIS and ASTM standards.
Graphite Nodularity Measurement
Measures the graphite nodularity of ground cast iron and displays results based on JIS nd ASTM standards.
Image Capture
DS-L2 Camera Control Unit
Built-in, high-definition, large 8.4-inch XGA LCD screen lets you view & discuss the sample without the need to look in the eyepieces.
Easily Save/Print Data
Captured images can be saved to USB memory or a CF card. In addition to printing directly via a PictBridge-compatible printer, you can save data onto a server over a LAN.
Status Display
Displays information for the objective lens and illumination conditions. Since the correct calibration data is automatically changed when changing magnification, the DS-L2's simple measurement function can be easily employed.
Energy Saving
The 50W halogen light source realizes the same brightness as the previous 100W light source with only about half the power consumption.
Accessories
- LV series motorized nosepiece
- Abundant sample holder
- DIA pillar
- INTENSILIGHT fiber illumination system
- Magnification module
For More Information Please Visit :
http://www.nikonmetrology.com/Products/Microscope-Systems/Inverted-Microscopes/Eclipse-MA200
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